3

Charged defects on Ge(111)-c(2×8): characterization using STM

Year:
2000
Language:
english
File:
PDF, 534 KB
english, 2000
7

surface studied by scanning tunneling microscopy

Year:
1997
Language:
english
File:
PDF, 382 KB
english, 1997
8

” surface studied by scanning tunneling microscopy

Year:
1997
Language:
english
File:
PDF, 327 KB
english, 1997